X-ray Diffractometer
Name of the Equipment : SmartLab automated multipurpose X-ray Diffractometer
Make : Rigaku
Model : Smartlab
Working Principle:
X-ray diffraction analysis (XRD) is a technique used to determine the crystallographic structure of a material. X-ray diffraction is based on constructive interference of monochromatic X-rays and a crystalline sample. These X-rays are generated by a cathode ray tube, filtered to produce monochromatic radiation, collimated to concentrate, and directed toward the sample.
X-ray diffraction is based on Bragg's law. 2dSinθ=nλ
Technical specifications:
Source of X-ray |
Cu Kα1 - 1.542 Å & Cu Kα2 - 1.544 Å (Wave length) |
Detector |
Hybrid Pixel 2-Dimensional Detector (Hypix-3000) |
Sample Stage |
Fixed, With X-ray source & detector rotation |
Sample Holder |
Glass sample holder, Aluminium Sample holder, Low background Sample holder, Transmission SAXS sample holder, Capillary holder. |
Working condition |
Maximum rated load- 9KW, Rated tube voltage - 20KV to 45 KV Rated tube current - 10mA to 200mA |
Measurement range |
0 - 1550 |
Applications:
- Room temperature XRD
- Low temperature XRD (Up to 4K)
- High Temperature XRD (Up to 15000C)
- Reflectivity (XRR)
- Rocking Curve
- Transmission SAXS
- Pole Figure/Texture
- RSM