S. N. Bose National Centre for Basic Sciences

Under Department of Science and Technology, Govt. of India

Technical Cell - Central Equipment Facilities

Atomic Force Microscopy (AFM)

System Configurations

Operates in Contact Mode, Tapping Mode, Phase Imaging, Lift Mode, Magnetic Force Microscopy (MFM), Electrostatic Force Microscopy (EFM), Lateral Force Microscopy, Force Spectroscopy.

Optional: Scanning Tunneling Microscopy (STM), Conductive Atomic Force Microscopy (CAFM), Nanolithography.

Model no: di INNOVA
Fig: Location: AFM lab, S.N. Bose National Centre For Basic Sciences

Measurement Performance


Large Area(~90μm) piezoelectric scanner.
Large area scanner
XY > 90 μm, Z > 7.5 μm
Closed-loop XY noise
< 1.2 nm RMS, typical imaging bandwidth
Z-Linearizer noise
< 200 pm RMS, typical imaging bandwidth
Open-loop XY drift
< 1 nm/min
Closed-loop XY drift
< 3 nm/min
5x motorized zoom, software controlled
10x objective
System software
NanoDrive v8 real-time control & NanoScope Analysis

Operating Environment

Temperature: 0ºC to 30ºC, 32ºF to 112ºF.
Humidity: < 60%; non condensing.