S. N. Bose National Centre for Basic Sciences

Under Department of Science and Technology, Govt. of India

Technical Cell - Central Equipment Facilities

Environmental Scanning Electron Microscope (ESEM)

Fields of Research

  • SEM imaging with high resolution and high contrast.
  • Chemical analysis (EDAX).
  • Investigations of non-conductive specimens under low-vacuum conditions.
  • Investigations of wet samples at pressures up to 2600 pa under ESEM mode.
  • Peltier effect on E-SEM (We can cool between 0ºC to 10ºC, specimen of very diverse in nature can be imaged)
Fig: Environmental Scanning Electron Microscope (ESSM) unit

Specifications and Performance

Source of electron
Operational voltage
200 V-30 KV


@30KV@High vacuum conditions
2.4 nm
@30KV@Low vacuum conditions
3.0 nm
@30KV@E-Sem conditions
5.4 nm
Beam current
100 μA


  • Everhart-thornley detector for secondary electrons in high vacuum.
  • GSED for pressures up to 40mbar in ESEM mode operation.
  • Large field secondary electron detector for low vacuum operation.