S. N. Bose National Centre for Basic Sciences
Under Department of Science and Technology, Govt. of India
Technical Cell - Central Equipment Facilities
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Equipments
Atomic Force Microscopy (AFM)
System Configurations
Operates in Contact Mode, Tapping Mode, Phase Imaging, Lift Mode, Magnetic Force Microscopy (MFM), Electrostatic Force Microscopy (EFM), Lateral Force Microscopy, Force Spectroscopy.
Optional: Scanning Tunneling Microscopy (STM), Conductive Atomic Force Microscopy (CAFM), Nanolithography.
Model no: di INNOVA
Fig: Location: AFM lab, S.N. Bose National Centre For Basic Sciences
Measurement Performance
Standard
Scanner
Large Area(~90μm) piezoelectric scanner.
Large area scanner
XY > 90 μm, Z > 7.5 μm
Closed-loop XY noise
< 1.2 nm RMS, typical imaging bandwidth
Z-Linearizer noise
< 200 pm RMS, typical imaging bandwidth
Open-loop XY drift
< 1 nm/min
Closed-loop XY drift
< 3 nm/min
Optics
5x motorized zoom, software controlled
10x objective
10x objective
System software
NanoDrive v8 real-time control & NanoScope Analysis
Operating Environment
Temperature: 0ºC to 30ºC, 32ºF to 112ºF.
Humidity: < 60%; non condensing.