S. N. Bose National Centre for Basic Sciences

Under Department of Science and Technology, Govt. of India

Technical Cell - Central Equipment Facilities

Field Emission Scanning Electron Microscopy (FESEM)

Fig: Field Emission Scanning Electron Microscopy instrument

Technical Specification

Source of electron
FEG Source
Operational accelerating voltage
@30KV@High vacuum conditions: 1.2 nm
@30KV@Low vacuum conditions: 3.0 nm


  • Everhart-thornley detector for secondary electrons in high vacuum.
  • GSED for pressures up to 2600KPA in ESEM mode operation.
  • Large field secondary electron detector for low vacuum operation.
  • Back scattered electron detector in high vacuum mode imaging.

Fields of Research

  • FESEM imaging with high resolution and high contrast.
  • Chemical analysis (EDAX).
  • Investigations of non-conductive specimens under low-vacuum conditions.
  • Investigations of wet samples at pressures up to 2600PA under ESEM mode.