S. N. Bose National Centre for Basic Sciences

Under Department of Science and Technology, Govt. of India

"The official Facebook page of S. N. Bose National Centre for Basic Sciences has been attacked. We urge our followers to be careful of the posts that appear on the page starting from 27/01/2025 midnight. We are working to resolve this issue ASAP and will publicly notify once we get the access back. We regret this inconvenience."

 Attention

Technical Cell - Central Equipment Facilities

Links

Equipments

Field Emission Scanning Electron Microscopy (FESEM)

Fig: Field Emission Scanning Electron Microscopy instrument

Technical Specification

Source of electron
FEG Source
Operational accelerating voltage
200V-30KV
Resolution
@30KV@High vacuum conditions: 1.2 nm
@30KV@Low vacuum conditions: 3.0 nm

Detectors

  • Everhart-thornley detector for secondary electrons in high vacuum.
  • GSED for pressures up to 2600KPA in ESEM mode operation.
  • Large field secondary electron detector for low vacuum operation.
  • Back scattered electron detector in high vacuum mode imaging.

Fields of Research

  • FESEM imaging with high resolution and high contrast.
  • Chemical analysis (EDAX).
  • Investigations of non-conductive specimens under low-vacuum conditions.
  • Investigations of wet samples at pressures up to 2600PA under ESEM mode.
NEW