S. N. Bose National Centre for Basic Sciences

Under Department of Science and Technology, Govt. of India

Technical Cell - Central Equipment Facilities

X-ray Diffractometer (XRD)

This is a PANalytical X-PERT PRO XRD unit installed in 2005 and it has the capability of performing

  • Powder diffraction
  • Thin film and multi-layer reflectivity
  • High resolution rocking curve analysis
  • Stress/texture analysis
  • Small angle x-ray scattering (SAXS)
Fig: X-ray Diffractometer unit

Specifications and Performance

Model No.
PANalytical X-PERT PRO
Source of X-Rays
Cu Kα, 1.54 Å. (wave length), Mo Kα, 0.71 Å (Wavelength)
Pixcel dectector, Scintillation detector
Sample stage
Fixed, with X-Ray source & Detector rotation.
Sample Holders
Sample holders are made of Aluminium, for powder samples with a volume of 15 mm×20 mm×1.8mm.
Zero background capillaries & fibres
Zero background sample holder is an obliquely cutted silicon crystal which can be used to mount very small amount of powder (< 1 mg).
Measurement range
5º to 140º
Working condition
45 KV & 40 mA


The system has been upgraded with high temperature attachment (1500 ºC) attachment.